Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)

Price: $38.00

Quantity: 2 available

Book Condition: New


0735402779

Title: Characterization and Metrology for ULSI Technology 2005 (AIP Conference Proceedings / Materials Physics and Applications)

Author Name:

Categories: Electronics,

Publisher: American Inst. of Physics:

ISBN Number: 0735402779

ISBN Number 13: 9780735402775

Binding: Hardcover

Book Condition: New

Seller ID: DEEP5A005